{"id":28,"date":"2016-08-03T15:37:39","date_gmt":"2016-08-03T15:37:39","guid":{"rendered":"https:\/\/sites.krieger.jhu.edu\/chienlab\/?page_id=28"},"modified":"2016-08-03T15:37:39","modified_gmt":"2016-08-03T15:37:39","slug":"facilities","status":"publish","type":"page","link":"https:\/\/sites.krieger.jhu.edu\/chienlab\/facilities\/","title":{"rendered":"Facilities"},"content":{"rendered":"<h3>Experimental Facilities and Shared Facilities Available to Group Members<\/h3>\n<hr \/>\n<h3>Fabrication and Processing<\/h3>\n<p>Sputter deposition<\/p>\n<ul>\n<li>Four-source small chamber system<\/li>\n<li>Four-source new chamber system<\/li>\n<li>Six-source large chamber system with plasma and ion milling guns<\/li>\n<li>Ten-source AJA system with e-beam evaporation chamber<\/li>\n<\/ul>\n<p>Nova 600 Dual Beam focused ion beam<\/p>\n<p>Lambda-Physik pulsed laser deposition system<\/p>\n<p>Tubular furnaces (up to 1500\u00b0C)<\/p>\n<p>Centorr tri-arc furnace<\/p>\n<p>Spex 8000 high-energy ball mill<\/p>\n<p>Perkin-Elmer UHV deposition system<\/p>\n<p>Optical and electron beam lithography<\/p>\n<hr \/>\n<h3>X-ray Characterization<\/h3>\n<p>MRD dual beam x-ray diffraction system<\/p>\n<p>MPD 4-circle x-ray diffraction system<\/p>\n<p>Laue x-ray diffractometer<\/p>\n<p>X-ray photoelectron spectrometer<\/p>\n<hr \/>\n<h3>Electron Microscopy Facilities<\/h3>\n<p>Amray 1860 FEG high resolution SEM<\/p>\n<p>Zeiss EVO 50 SEM<\/p>\n<p>Philips 420ST TEM<\/p>\n<p>300 keV HRTEM with FEG and GIF<\/p>\n<hr \/>\n<h3>Surface Characterization Facilities<\/h3>\n<p>Tencor Thin film profilometer<\/p>\n<p>Digital Instruments multimode AFM\/MFM<\/p>\n<p>STM tip etching and coating set-up<\/p>\n<p>Perkin-Elmer LEED Auger surface analytical system<\/p>\n<hr \/>\n<h3>Measurement of Physical Properties<\/h3>\n<p>Quantum Design SQUID magnetometer<\/p>\n<p>DMS model 10 vector vibrating sample magnetometer<\/p>\n<p>DMS 1660 cryostat vibrating sample magnetometer<\/p>\n<p>Magneto-transport properties<\/p>\n<p>AC susceptometer<\/p>\n<p>Point contact spectroscopy<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Experimental Facilities and Shared Facilities Available to Group Members Fabrication and Processing Sputter deposition Four-source small chamber system Four-source new chamber system Six-source large chamber system with plasma and ion milling guns Ten-source AJA system with e-beam evaporation chamber Nova 600 Dual Beam focused ion beam Lambda-Physik pulsed laser deposition system Tubular furnaces (up to [&hellip;]<\/p>\n","protected":false},"author":47,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-28","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/sites.krieger.jhu.edu\/chienlab\/wp-json\/wp\/v2\/pages\/28","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/sites.krieger.jhu.edu\/chienlab\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sites.krieger.jhu.edu\/chienlab\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sites.krieger.jhu.edu\/chienlab\/wp-json\/wp\/v2\/users\/47"}],"replies":[{"embeddable":true,"href":"https:\/\/sites.krieger.jhu.edu\/chienlab\/wp-json\/wp\/v2\/comments?post=28"}],"version-history":[{"count":5,"href":"https:\/\/sites.krieger.jhu.edu\/chienlab\/wp-json\/wp\/v2\/pages\/28\/revisions"}],"predecessor-version":[{"id":33,"href":"https:\/\/sites.krieger.jhu.edu\/chienlab\/wp-json\/wp\/v2\/pages\/28\/revisions\/33"}],"wp:attachment":[{"href":"https:\/\/sites.krieger.jhu.edu\/chienlab\/wp-json\/wp\/v2\/media?parent=28"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}